Main characteristics
Low energy ion scattering (LEIS), angle-resolved XPS, selected area XPS, etching, depth profiling. High pressure cell (HPC) for sample treatment and reactions.

Applications
The instrument is able to characterize solid surfaces in all stages of their reactions carried out in HPC. Samples are treated in it at elevated temperatures in flowing reactants, while after evacuation and re-location they are characterized in the analysis chamber under UHV conditions. All kinds of non-volatile and X-ray resistant solids can be examined and characterized. Spectra provide both qualitative and quantitative information on the composition of the uppermost few atomic layers of the sample surface. In a unique manner the oxidation state(s) of the constituent elements can also be determined.